Software

The new ASTM E2737 Detector Evaluation Package is available to suit the entire range of Nikon Metrology’s X-ray CT inspection, metrology and large envelope CT systems. All of the manufacturer's X-ray sources are supported including rotating target technology and the world's only 450kV microfocus source, in addition to the full range of industry-leading detectors. 

With the new S-250(u) and C-350 cards, Swissbit has extended the long-term availability of its robust and durable storage media to a total of almost 20 years. While NAND flash products usually have a short availability due to relatively rapid innovation cycles, Swissbit meets the critical requirements of industrial embedded systems with long life cycles through these special products. The S-250-SD and S-250u-microSD memory cards are SLC-based memory products that comply with the SD standard and support the SPI mode.

XM-60 has become the market leading solution for direct measurement of all six degrees of freedom (linear, vertical and horizontal straightness, pitch, yaw and roll) on any form of linear axis. With the addition of the new XM-60 long range measurement functionality in CARTO 4.2, unlimited measurement range is now possible for the first time. 

The Sapphire product family now includes Sapphire Gen 2, the 1-meter tall Sapphire 1MZ and Sapphire XC—all using the laser powder-bed fusion (LPBF) process with patented capabilities to print without consideration of support structures. Sapphire systems specifically address the aerospace, power generation, and energy markets' unmet needs for quality-assured manufacturing of uncompromised geometries.