Contracer CV-3200/4500 Contour Measuring Systems

July 12, 2012

Mitutoyo America Corp. announces availability of Contracer CV-3200/4500 Series contour measuring systems. These instruments offer significantly increased productivity by combining fast traverse speeds with many time saving and accuracy enhancing innovations.

The new Contracer CV-3200/4500 Series machines feature a precision arc-scale built into the Z1 axis (detector) allowing the arc trajectory of the stylus tip to be read directly, thus minimizing error for best in-class accuracy. Both series employ an innovative detector arm that lowers workpiece interference while expanding range in the Z1 (detector) axis. The arm is also equipped with collision auto-stop to assure measurement safety even during high-speed movement. Additional safety features in the joystick unit include a drive speed control knob and emergency stop switch.

The Contracer CV-4500 features continuous measurement of both upper and lower surfaces via a double-sided, conical stylus. This continuous measurement data can be used to facilitate analysis of features that otherwise would be difficult to measure, such as the effective diameter of an internal screw-thread. The CV-3200/4500 Series machines incorporate a Mitutoyo ABS (Absolute) scale eliminating the need to reset the origin. Dedicated calibration gages enable the systems to perform sensitive calibrations including Z1-axis gain, symmetry, and stylus radius, in a single, simple operation.

Contracer CV-3200/4500 Series contour measuring systems include FORMTRACEPAK contour analysis software as standard. Available in 15 language views, FORMTRACEPAK offers complete surface roughness and contour inspection, and reporting functionality including new measuring force adjustment capabilities.

Contracer CV-3200/4500 Series instruments support output to measurement data applications such as MeasurLink, Mitutoyo's real-time, statistical process control and data analysis software solution, appropriate for stand-alone and enterprise wide data management needs.

Related Glossary Terms

  • calibration


    Checking measuring instruments and devices against a master set to ensure that, over time, they have remained dimensionally stable and nominally accurate.

  • process control

    process control

    Method of monitoring a process. Relates to electronic hardware and instrumentation used in automated process control. See in-process gaging, inspection; SPC, statistical process control.

  • statistical process control ( SPC)

    statistical process control ( SPC)

    Statistical techniques to measure and analyze the extent to which a process deviates from a set standard.