SFP2 Surface Finish Measurement Probe

February 21, 2018
SFP2 Surface Finish Measurement Probe for REVO

Renishaw announces the SFP2 – a new, improved surface finish measurement probe – for use with its REVO 5-axis measurement system on CMMs. The SFP2 probe increases the surface finish measurement ability of the REVO system, which offers a multisensor capability providing touch-trigger, high-speed tactile scanning and noncontact vision measurement on a single CMM.

Combining surface finish measurement and dimensional inspection on the CMM presents advantages over traditional inspection methods that require a separate process, according to the company. Powered by 5-axis measurement technology, the SFP2’s automated surface finish inspection offers significant time savings, reduced part handling and greater return on CMM investment.

The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for REVO. This provides the flexibility to easily select the optimal tool to inspect a range of features on the same CMM platform. Data from multiple sensors is automatically referenced to a common datum.

The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw's MODUS metrology software.

Renishaw’s award winning REVO 5-axis measurement system is the only scanning system for CMMs that simultaneously controls the motion of three machine and two head axes while collecting workpiece data. Using its range of 2D and 3D tactile probes, surface finish measurement and noncontact vision probes, the REVO system enhances the speed and accuracy of part inspection on CMMs.

Related Glossary Terms

  • metrology

    metrology

    Science of measurement; the principles on which precision machining, quality control and inspection are based. See precision machining, measurement.

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